Accu-Scan Ultrasonic Immersion Test Tank

DAQ, scan motion control, image processing and pixel analysis software

 

A-B Axes Specifications

Travel: +/- 40 degrees in the A-axis, +/- 120 degrees in the B-axis

Position accuracy: +/- 0.1 degree

Repeatability: +/- 0.1 degree

Backlash: 0.01 degree

Velocity: 45 degrees/sec

Acceleration: 120 degrees/sec

 

Z-Axis Specifications

Position accuracy: +/- 0.003"/ft

Resolution: 0.0001"

Repeatability: +/- 0,001"/ft

Backlash: 0.002"

Velocity: 2.0"/sec

Acceleration: 2.0"/sec

 

X-Y Axes Specifications

Position accuracy: +/- 0.003"/ft.

Resolution: 0.0001"

Repeatability: +/- 0.001"/ft.

Backlash: 0.002"

Velocity: up to 10"/sec

Acceleration: up to 10"/sec

 

Accuscan Software

A, B and C scan

X, Y, Z, A and B axis control

Region of interest (ROI) pixel area analysis

Multiple user and/or part setups

Written in C++ and LabVIEW for easy modifications and customer-specific applications.

 

 

7 Amplitude and time-of-flight flaw gates. 1 phase gate.

Pulser/Receiver control

Save screen and image

Depending upon application, data acquisition rates of up to 400 data points/sec at 1 G/sample, 8-bit resolution.

 

 

Phase Gate

As well as amplitude and time-of-flight (TOF), Accuscan provides phase inversion data.

Evaluating the integrity of a weld or bond is commonly done by monitoring the amplitude of the returned signal. This works well if the two materials have similar acoustic impedances. However, if the two bonded pieces differ the change in amplitude of the reflected signal can be less apparent. This can be remedied utilizing a phase gate.

In Accu-Scan, if the pulse is traveling from a slower material to a faster material, the phase is unchanged and the pixel image is blue. If it travels from a faster material to a slower material, the phase is inverted and the pixel is red. If there is insufficient signal return or the phase is undetermined the pixel will be green.

Phase gate can be set for normal phase 'up' or normal phase 'down'.

 
 
 
 

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Updated: August 10, 2005

Copyright © 2005, American NDT, Inc., Lancaster, Ohio, USA